Optical cantilever based analyte detection

ABSTRACT

An apparatus for detecting a deflection of a beam, the apparatus comprising a beam having a first side and a second side; and a grating structure positioned adjacent the second side of the beam, the grating structure including an interrogating grating coupler configured to direct light towards the beam; wherein the beam and the interrogating grating coupler form a resonant cavity, and light input to the resonant cavity is modulated according to the deflection of the beam.

CROSS REFERENCE TO RELATED APPLICATION

This application is a continuation-in-part of U.S. patent application Ser. No. 13/035,374, filed Feb. 25, 2011 and U.S. patent application Ser. No. 13/761,987, filed Feb. 7, 2013, which claims priority to Australian Patent Application No. 2012900444, filed Feb. 7, 2012, the disclosures of which are hereby incorporated by reference in their entirety.

FIELD OF THE INVENTION

The present invention relates to a system, an apparatus and a method for determining a deflection of a beam or more particularly the deflection of a cantilever.

BACKGROUND OF THE INVENTION

Different methods for detecting chemical and biological analytes have been used. Such technology has been used, for example, in process control, environmental monitoring, medical diagnostics and security.

Mass spectroscopy is one approach to detect such analytes. The process begins with an ionized sample. The ionized sample is shot through a vacuum that is subjected to an electromagnetic field. The electromagnetic field changes the path of lighter ions more than heavier ions. A series of detectors or a photographic plate are then used to sort the ions depending on their mass. The output of this process, which is the signal from the detectors or the photographic plate, can be used to determine the composition of the analytes in the sample.

A disadvantage of mass spectroscopy instruments is that they are generally high-cost instruments. Additionally, they are difficult to ruggedize, and are not useful for applications that require a sensor head to be remote from signal-processing electronics.

A more recent approach is to use Micro Electro Mechanical Systems (MEMS)-based microstructures, and more specifically micro-cantilevers. These are extremely sensitive systems, and several demonstrations of mass sensors that have detection limits as low 10⁻²¹ g, approximately the mass of a single protein molecule, have been performed. While these experiments have been performed in idealised environments, practical cantilever-based systems have been demonstrated for the detection of a wide range of single analytes.

A portion of the micro-cantilever is coated with an analyte selective coating to which the analyte is adsorbed.

There are two common modes of operation of micro-cantilever sensors, namely static and dynamic.

In the static mode, a stress differential is induced across the cantilever due to preferential adsorption of an analyte onto the analyte selective coating causing the cantilever to bend. The extent of the bending is in direct relation to the amount of analyte adsorbed. The stress differential can be induced by the analyte causing swelling of an overlayer, or by changes in the Gibbs free energy of the surface.

In the dynamic mode, the adsorbed analyte changes the mass of the cantilever and hence its mechanical resonance frequency. The rate and size of the change in resonance frequency is then measured to estimate the analyte concentration. Active sensing using these structures is achieved by resonant excitation.

In general, long, compliant cantilevers are required for sensitive static sensors, while high sensitivity for dynamic sensors dictate that short, stiff beams with high Q-factor mechanical resonances are needed. The most sensitive MEMS-based sensors to date have been based on measurements of resonant frequency.

Readout technologies used with micro-cantilever sensors are primarily based on optical techniques developed for atomic force microscopy (AFM) analysis. Here, light is reflected from the cantilever tip to a distant quadrant detector, which process is referred to as optical leveraging. Electrical sensing and optical sensing techniques are also used. Electrical sensing includes piezoresistive, piezoelectric, capacitive, Lorentz force/emf sensing and tunnelling current techniques. Optical sensing techniques include optical sensing based on optical interference, the optical interference being either in an interferometer or in the use of diffraction from an optical grating formed by a line of cantilevers. This latter configuration using an optical grating formed by a line of cantilevers is often described as an array in literature, but is still effectively a sensor for a single analyte.

Another approach to analyte detection is where large, compact, integrated arrays of individual sensors are used, particularly for multi-analyte, multi-analysis applications. These are particularly useful when an unknown substance is to be identified or if there is a number of chemical species to be tested for simultaneously. Examples of such requirements can be found in the screening of food for pesticide residues where there are many different potential contaminants, detection of different antibodies in a single blood sample, or the presence of any of the many possible illicit drugs or explosives in luggage. Additionally, an array of sensors can also give significantly improved statistics of detection (including fewer false-positives and false-negatives) by averaging the response over a large number of sensors, and allows the use of multivariate statistical chemometric techniques, as are typically applied in spectroscopic analysis.

There are several disadvantages with the sensors of today. There is, for example, a lack of compact, robust and cost-effective read-out technology that combines high sensitivity with high dynamic range. Sensors that are good at detecting small amounts of analyte typically have poor dynamic range which is especially noticeable when the levels of analyte are large. A problem with AFM-based cantilever systems is that they are very large as they incorporate bulky free space optics requiring a sensor for each cantilever output. A problem with electrical cantilever systems is that they require extensive power on-chip electronics.

As is known in the art, an Atomic Force Microscope (AFM) consists of a cantilever with a pointed tip or probe at its end that is used to scan a sample surface. The cantilever is typically made of silicon or silicon nitride with a tip radius of curvature in the order of nanometers using micro-electromechanical fabrication techniques. When the tip is brought into proximity of the sample surface, forces between the tip and the sample lead to a deflection of the cantilever according to Hooke's law.

Interatomic forces between the probe tip and the sample surface cause the cantilever to deflect as the sample's surface topography (or other properties) change as the tip is scanned across the sample. A laser light reflected from the back of the cantilever measures the deflection of the cantilever. This information is fed back to a computer, which generates a map of topography and/or other properties of interest.

Various measurements can be made including measuring either the deflection of the cantilever (static mode) or a vibration frequency of the cantilever (dynamic mode). In some applications, the tip is coated with a thin film of ferromagnetic material that reacts to magnetic areas on the sample surface. Some applications include:

-   -   Measuring 3-dimensional topography of an integrated circuit         device     -   Roughness measurements for chemical mechanical polishing     -   Analysis of microscopic phase distribution in polymers     -   Mechanical and physical property measurements for thin films     -   Imaging magnetic domains on digital storage media     -   Imaging of submicron phases in metals     -   Defect imaging in IC failure analysis     -   Microscopic imaging of fragile biological samples     -   Metrology for compact disk stampers

A problem with current AFMs is that the sensitivity is limited by shot noise in the optical detection system. Although Brownian motion of the cantilever is a contributor to the noise, in practice it is not a factor as the shot noise is substantially greater than the noise induced by Brownian motion. While noise induced by Brownian motion may be reduced by cooling the cantilever, this is not practical for current AFMs as it may interfere with the alignment of the optical system. A further problem is that, the process of measuring an entire surface of a sample is time consuming, as the probe tip must make many passes over the sample in order to build up an image.

Yet a further problem with current AFMs is that the probe often needs to be replaced, and each time the probe is replaced the optical detection system needs to be re-calibrated, which is a time consuming process.

There is therefore a need for an improved system and method of performing atomic force measurements.

SUMMARY OF THE INVENTION

In a broad form, the invention resides in an apparatus for detecting a deflection of a beam, the apparatus comprising:

a beam having a first side and a second side; and

a grating structure positioned adjacent the second side of the beam, the grating structure including an interrogating grating coupler configured to direct light towards the beam;

wherein the beam and the interrogating grating coupler form a resonant cavity, and light input to the resonant cavity is modulated according to the deflection of the beam.

In another broad form, the invention resides in a method for detecting a deflection of a beam, the method comprising the steps of:

inputting light into a resonant cavity formed between a beam and a grating structure of a sensor;

receiving light modulated by a deflection of the beam; and

analysing the modulated light to determine the deflection of the beam.

Preferably, the beam is a cantilever.

In one embodiment, the invention resides in an apparatus for detecting a presence of one or more analytes in a sample, the apparatus comprising a first cantilever comprising an analyte selective coating that is selective to said one or more analytes, a first grating coupled resonating structure positioned adjacent to the cantilever and comprising a first interrogating grating coupler, wherein the first interrogating grating coupler and the cantilever form an optical resonant cavity.

Preferably, the cantilever is dynamic.

Alternatively, the cantilever is static.

Preferably, the apparatus further comprises a second grating coupled resonating structure wherein the second grating coupled resonating structure comprises a second interrogating grating coupler; and the second interrogating grating coupler and the cantilever form an optical resonant cavity.

Preferably, the second grating coupled resonating structure is positioned adjacent to the first grating coupled resonating structure on an axis substantially parallel to the cantilever.

Preferably, the apparatus further comprises a signal analyser for detection of the presence of one or more analytes in the sample.

Preferably, the signal analyser compares light modulated by the first grating coupled resonating structure and the cantilever with a plurality of predefined signals.

Preferably, the first grating coupled resonating structure provides an initial measurement, and the second grating coupled resonating structure provides a refinement of said initial measurement.

Preferably, the first grating coupled resonating structure and the second grating coupled resonating structure are used to determine a shape of the cantilever.

Optionally, the apparatus further comprises:

a second cantilever;

a second grating coupled resonating structure comprising a second interrogating grating coupler;

wherein the second interrogating grating coupler and the second cantilever form an optical resonant cavity.

Preferably, the first grating coupled resonating structure and the second grating coupled resonating structure are optically coupled in series.

Optionally, the first grating coupled resonating structure and the second grating coupled resonating structure are optically coupled in parallel.

In another form, the invention resides in a method of detecting the presence of one or more analytes in a sample. The method comprises the steps of applying the sample to a cantilever, wherein the cantilever comprises an analyte selective coating selective to the one or more analytes, passing an optical signal through a grating coupled resonating structure, wherein the grating coupled resonating structure is arranged to form a resonant cavity with the cantilever; and analysing the optical signal.

Preferably, the cantilever is dynamic, and the step of analyzing the optical signal comprises determining the resonance frequency of the cantilever and comparing the resonance frequency to known resonant characteristics of the cantilever.

Alternatively, the cantilever is static, and the analysis step comprises determining a deflection of the cantilever.

Preferably, the cantilever is dynamic, and the step of analyzing the optical signal comprises determining the resonance frequency of the cantilever and comparing the resonance frequency to known resonant characteristics of the cantilever.

Preferably, the step of analyzing the optical signal comprises comparing the optical signal to a plurality of predefined signals.

Preferably, the method further comprises the steps of passing a second optical signal through a second grating coupled resonating structure, wherein the second grating coupled resonating structure is arranged to form a resonant cavity with the cantilever, and analyzing the second optical signal.

Preferably, the step of analysing the optical signal comprises estimating an initial cantilever deflection measurement, and the step of analyzing the second optical signal comprises refining the initial cantilever deflection measurement

Preferably, the method further comprises the step of estimating a shape of said cantilever, wherein the step of analysing the optical signal comprises estimating a cantilever deflection measurement at a first position, and the step of analysing the second optical signal comprises estimating a cantilever deflection measurement at a second position.

In yet another form, the invention resides in a system for performing atomic force measurements including:

a sensor including:

a beam having a first side and a second side, the beam including a tip positioned on a surface of the first side for interacting with a sample; and

a grating structure positioned adjacent the second side of the beam, the grating structure including an interrogating grating coupler configured to direct light towards the beam;

a light source optically coupled to an input of the sensor for inputting light; and

an analyser coupled to an output of the sensor; wherein

the beam and the interrogating grating coupler form a resonant cavity, a movement of the beam modulates the light source and the analyser determines a deflection of the beam according to the modulated light.

Preferably, the beam is a cantilever beam. Alternatively, the beam is fixed at opposite ends and includes a flexible portion between the ends. Preferably, the tip is positioned between the two ends of the beam.

Preferably, the modulated light is amplitude modulated. Alternatively or additionally, the modulated light is frequency modulated.

Preferably, the system includes a plurality of sensors.

Preferably, the system further includes a de-multiplexer wherein an input of the de-multiplexer is optically connected to the light source and each output of a plurality of outputs of the de-multiplexer is optically connected to a respective input of a grating structure of a respective sensor.

Preferably, the system further includes a multiplexer wherein each output of the plurality of grating structures of a respective sensor is optically connected to an input of the multiplexer, and the output of the multiplexer is connected to the analyser.

Preferably the de-multiplexer is a wavelength division de-multiplexer.

Preferably, light input into the multiplexer is separated into a plurality of discrete wavelengths and/or wavelength bands.

Preferably, each wavelength of the plurality of discrete wavelengths is modulated by a respective sensor.

In yet another form the invention resides in a method of performing atomic force measurements on a sample, the method including the steps of:

inputting light into a resonant cavity formed between a beam and a grating structure of a sensor;

receiving at an analyser light modulated by a movement of the beam; and

analysing the modulated light to determine a characteristic of the sample.

Preferably, the characteristic is a topography of the sample.

BRIEF DESCRIPTION OF THE DRAWINGS

To assist in understanding the invention and to enable a person skilled in the art to put the invention into practical effect, preferred embodiments of the invention will be described by way of example only with reference to the accompanying drawings, in which:

FIG. 1 shows a side sectional view of an optical microcantilever waveguide, according to the prior art;

FIG. 2 shows a top perspective view of an optical microcantilever sensor according to an embodiment of the invention;

FIG. 3 shows a front sectional view of the optical microcantilever sensor according to an embodiment of the invention;

FIG. 4 shows a side sectional view of an optical microcantilever sensor according to a second embodiment of the invention;

FIG. 5 is a graph showing the periodic nature of a signal of a transmission power according to an embodiment of the invention;

FIG. 6 shows a schematic diagram of an optical microcantilever sensor according to a third embodiment of the invention;

FIG. 7 shows a schematic diagram of an optical microcantilever sensor according to a fourth embodiment of the invention;

FIG. 8 shows a schematic diagram of an optical microcantilever sensor according to a fifth embodiment of the invention;

FIG. 9 shows a schematic diagram of an optical microcantilever sensor 900 according to a sixth embodiment of the invention;

FIG. 10 is a bottom perspective view of a system for performing atomic force measurements;

FIG. 11 is a cross-sectional end view of a sensor of FIG. 1;

FIG. 12 is a block diagram illustrating a system of an array of the sensors shown in FIGS. 10 and 11 for performing atomic force measurements; and

FIG. 13 illustrates a method of performing atomic force measurements on an object, according to an embodiment of the present invention.

DETAILED DESCRIPTION

While the present invention is open to various modifications and alternative constructions, the example embodiments shown in the drawings will be described herein in detail. It is to be understood, however, there is no intention to limit the invention to the particular example forms disclosed. On the contrary, it is intended that the invention cover all modifications, equivalences and alternative constructions falling within the spirit and scope of the invention as expressed in the appended claims.

FIG. 1 shows a side sectional view of an optical microcantilever waveguide 100, according to the prior art. The optical microcantilever waveguide 100 comprises a fixed component 102 and a dynamic component 104. The fixed component is attached to an insulator 108 such as for example SiO₂ or Si3N₄. The insulator 108 is attached to a substrate 110 such as for example a Si substrate. This layered structure allows for the simple construction of the optical microcantilever waveguide 100 through layering of the substrate 110, the insulator 108 and the optical cantilever waveguide 100, and by then etching away an area of the insulator 108 (and possibly also an area of the substrate 110) forming a void 112 under the dynamic component 104 of the optical microcantilever waveguide 100. The dynamic component 104 of the microcantilever waveguide 100 is optically coupled to a fixed waveguide 106.

The dynamic component 104 is free to move above the void 112 in the insulator 108. Upon adsorbtion of an analyte, the mass of the dynamic component 104 of the optical microcantilever waveguide 100 changes. This change in mass results in a change of a resonance frequency of the optical microcantilever waveguide 100.

Light enters at an end of the fixed component 102 of the optical microcantilever waveguide 100 and propagates along the waveguide 100 to the dynamic component 104. Light exits the dynamic component 104 in a direction towards the fixed waveguide 106.

In a dynamic mode, the light entering the fixed waveguide 106 is amplitude modulated as a result of a coupling loss between the dynamic component 104 and the fixed waveguide 106 that is in close proximity to the dynamic component 104, which loss occurs as the dynamic component 104 vibrates. The light entering the fixed waveguide 106 is nominally modulated at twice the vibration frequency of the dynamic component 104 for symmetric vibration. Alternatively, in a static mode, the dynamic component 104 of the optical microcantilever waveguide 100 may change shape upon adsorbtion of an analyte. In this case the light entering the fixed waveguide 106 has an amplitude based upon the shape of the dynamic component 104 of the optical microcantilever waveguide 100.

The light entering the fixed waveguide 106 is analysed to detect the presence of an analyte on the optical microcantilever waveguide 100. The light may be compared to light with known characteristics, such as for example light modulated due to the presence of an analyte. Alternatively, the resonance frequency or shape of the optical microcantilever waveguide 100 may be estimated and compared to pre-determined characteristics.

The present invention resides in an apparatus for detecting a presence of one or more analytes in a sample. The apparatus comprises a cantilever and a grating coupled resonating structure positioned adjacent to the cantilever. The cantilever comprises an analyte selective coating that is selective to the one or more analytes. The grating coupled resonating structure comprises an interrogating grating coupler which forms an optical resonant cavity with the cantilever.

An advantage of the present invention is the ability to economically have a very large number of sensors on a small surface, enabling efficient detection on multiple analytes. Furthermore it does not require bulky free space optics or extensive power on-chip electronics.

FIG. 2 shows a top perspective view and FIG. 3 shows a front sectional view of an optical microcantilever sensor 200 according to an embodiment of the invention. As shown in FIG. 2 and FIG. 3, the optical microcantilever sensor 200 comprises a cantilever 205 and a grating coupled resonating structure 210. The grating coupled resonating structure 210 comprises an input grating coupler 215, an interrogating grating coupler 220 and an output grating coupler 225. The interrogating grating coupler 220 is placed directly under and adjacent to the cantilever 205. The cantilever 205 comprises an analyte selective coating and a reflective surface 207, where the reflective surface 207 is opposite the interrogating grating coupler 220. However it should be appreciated that the cantilever 205 may be a beam, or a cantilever without an analyte selective coating. Thus the present invention may be used to detect a movement of any type of beam or cantilever.

The input grating coupler 215 is optically connected to the interrogating grating coupler 220 and the interrogating grating coupler 220 is optically connected to the output grating coupler 225. The output grating coupler 225 is optically connected to a signal analyser, for example through an optical fibre.

Referring to FIG. 3, arrows illustrate the light path of the light through the optical microcantilever sensor 200.

Light is coupled to the input grating coupler 215 from a light source, via an optical waveguide or an optical fibre, for example. The light propagates along the grating coupled resonating structure 210 to the interrogating grating coupler 220 and out of the interrogating grating coupler 220 in a near perpendicular direction towards the cantilever 205. The light then propagates along the grating coupled resonating structure 210 to the output grating coupler 225.

The cantilever 205 and interrogating grating coupler 220 form a resonant cavity such that the amount and/or frequency of light coupled to the output grating coupler 225 is a function of the separation of the interrogating grating coupler 220 and the cantilever 205.

The light is output from the grating coupled resonating structure 210 via the output grating coupler 225 so that it may be analysed in real time or stored for analysis at a later time.

When a sample is applied to the cantilever 205, adsorbtion of an analyte may occur depending on the analyte selective coating and a composition of the sample.

A pattern or shape of the interrogating grating coupler 220, for example dimensions of grooves of the interrogating grating coupler 220, determines a modulation of light resonating between the interrogating grating coupler 220 and the cantilever 205. Additionally, a change in distance between the cantilever 205 and the interrogating grating coupler 220 causes a change in the modulation of the light output from the output grating coupler 225.

A change in mass of the cantilever 205 occurs upon adsorbtion of the analyte. In a dynamic mode of operation, the change in mass results in a change in resonance frequency of the cantilever 205 which may be compared to when the analyte is not present. The resonance frequency of the cantilever can be determined at the output grating coupler 225 through resonant excitation of the cantilever 205.

Alternatively, in a static mode of operation, the presence of an analyte causes a change in shape of the cantilever 205. The change in shape of the cantilever 205 causes a change in the distance between the cantilever 205 and the interrogating grating coupler 220 a and hence change in the light at the output grating coupler 225.

The signal analyser, which indicates the presence and concentration of the analyte in the sample, uses analysis of the light to estimate the resonance frequency of the cantilever 205, or in the case of a static cantilever the shape of the cantilever 205.

The resonance frequency of the cantilever 205 in dynamic mode operation, or the shape of the cantilever 205 in static mode, may be compared to known characteristics of the cantilever 205 to determine whether an analyte is present or not. Known characteristics of the cantilever 205 include resonance frequency without the presence of an analyte, resonance frequencies with the presence of a particular amount of analyte or concentration, shape without the presence of an analyte, shapes with the presence of a particular amount of analyte or concentration.

In an embodiment of the invention, the resonance frequency, height or position need not be calculated or estimated explicitly for each cantilever and measurement. Predefined signals of the cantilever at, for example, different resonance frequencies, heights or positions may be compared directly to the signal in the analysis step.

FIG. 4 shows a side sectional view of an optical microcantilever sensor 400 according to a second embodiment of the invention. The optical microcantilever sensor 400 comprises a cantilever 405 and a first, second and third grating coupled resonating structure 410 a, 410 b and 410 c, respectively, which are each specific examples of the grating coupled resonating structure 210 of FIG. 2. Similarly, the cantilever 405 is a specific example of the cantilever 205 of FIG. 2.

The first grating coupled resonating structure 410 a, placed under a distal end of the cantilever 405, can be used to measure fine changes in shape or fine movements in the cantilever 405.

The second grating coupled resonating structure 410 b is positioned adjacent to the first grating coupled resonating structure 410 a on an axis substantially parallel to the cantilever 405. The second grating coupled resonating structure 410 b, placed under a central part of the cantilever 405, can be used when larger change in shape or larger movements are to be measured, possibly in combination with the first grating coupled resonating structure 410 a. In this case the second grating coupled resonating structure 410 b provides a refinement of an initial measurement of the first grating coupled resonating structure 410 a.

The third grating coupled resonating structure 410 c is positioned adjacent to the second grating coupled resonating structure 410 b on an axis substantially parallel to the cantilever 405. The third grating coupled resonating structure 410 c is placed under a proximal end of the cantilever 405 and can be used when larger change in shape or larger movements are to be measured, possibly in combination with the first and second grating coupled resonating structures 410 a and 410 b. In this case the second grating coupled resonating structure 410 b provides a refinement of the initial measurement of the first grating coupled resonating structure 410 a and the refinement provided by the second grating coupled resonating structure 410 b.

As would be readily understood by those skilled in the art, any number of grating coupled resonating structures 410 may be placed under a single cantilever, and at any position, without deviating from the present invention.

The exemplary embodiments illustrated in FIG. 2, FIG. 3 and FIG. 4 are applicable to both static and dynamic cantilevers 205, 405, and in both gaseous and aqueous environments. Furthermore, the grating coupled resonating structure 210, 410 a, 410 b, 410 c can be oriented arbitrarily with respect to the cantilever 205, 405, and the design of the cantilever 205, 405 can be decoupled from the design of the grating coupled resonating structure 210, 410 a, 410 b, 410 c. A further valuable capability of this approach is that the multiple grating coupled resonating structures 210, 410 a, 410 b, 410 c under the single cantilever 205, 405, as described in FIG. 4, allows for the shape of the cantilever 205, 405 to be measured with greater precision.

Since an analyte can initially be adsorbed anywhere along the analyte selective coating of the cantilever 205, 405, a change in shape of the cantilever 205, 405 can be used as an early indication of the presence of the analyte. Further, as is discussed further in FIG. 5, it may be advantageous to have multiple grating coupled resonating structures to enhance a dynamic range of the optical microcantilever sensor 200, 300, 400.

FIG. 5 is a graph 500 showing the periodic nature of a signal 530 of a transmission power 510 according to an embodiment of the invention, with respect to a separation 520 between the cantilever 205, 405 and the grating coupled resonating structure 210, 410 a, 410 b, 410 c. As can be seen in the figure, separations 0.5, 1.25, 2 and 2.75 micrometers, for example, have similar transmission powers 510. This ambiguity can however be removed, while still maintaining high sensitivity, by measuring the displacement of the cantilever 205, 405 at multiple positions. FIG. 4 illustrates an example where multiple grating coupled resonating structures 210, 410 a, 410 b, 410 c are placed under a single cantilever. Such configurations allow for Vernier-like calculations to be made.

FIG. 6 shows a schematic diagram of an optical microcantilever sensor 600 according to a third embodiment of the invention. The optical microcantilever sensor 600 comprises a wavelength division de-multiplexer 605, the wavelength division de-multiplexer 605 comprising three optical outputs 610 a, 610 b, 610 c, three grating coupled resonating structures 615 a, 615 b, 615 c, a cantilever 620 and a wavelength division multiplexer 625.

An optical input is optically coupled to the wavelength division de-multiplexer 605. The wavelength division de-multiplexer 605 processes light from the optical input and splits the light into a plurality of subsignals, each subsignal having a particular wavelength or plurality of wavelengths. In this example, the wavelength division de-multiplexer 605 has the three optical outputs 610 a, 610 b, 610 c, each carrying light corresponding to a different wavelength or wavelength band.

The optical outputs 610 a, 610 b, 610 c are optically coupled to the grating coupled resonating structures 615 a, 615 b, 615 c. The grating coupled resonating structures 615 a, 615 b, 615 c are similar to the grating coupled resonating structures 210, 410 a, 410 b, 410 c. Each grating coupled resonating structure 615 a, 615 b, 615 c is connected in parallel and forms an optical resonance cavity with the cantilever 620. The wavelength division multiplexer 625 additively combines the light output from grating coupled resonating structures 615 a, 615 b, 615 c such that an output signal of the wavelength division multiplexer 625 comprises a single light signal comprising multiple wavelengths.

Analysis of an individual grating coupled resonating structure 615 a, 615 b, 615 c, may be performed by using pre-known characteristics of the grating coupled resonating structure 615 a, 615 b, 615 c. These characteristics include, for example, a wavelength throughput of the grating coupled resonating structure 615 a, 615 b, 615 c.

FIG. 7 shows a schematic diagram of an optical microcantilever sensor 700 according to a fourth embodiment of the invention. The optical microcantilever sensor 700 comprises two cantilevers 705 a, 705 b and two grating coupled resonating structures 710 a, 710 b.

The grating coupled resonating structures 710 a, 710 b form resonant cavities with the cantilevers 705 a, 705 b. The grating coupled resonating structure 710 a is optically coupled to the grating coupled resonating structure 710 b in series, i.e. an output of the first grating coupled resonating structures 710 a is connected in an input of the second grating coupled resonating structures 710 b.

Cantilever and grating coupled resonating structure pairs, for example 705 a and 710 a, or 705 b and 710 b, may be analysed individually. This is advantageous as each pair may be sensitive to a different analyte. The analysis may be performed by using pre-known characteristics of the grating coupled resonating structure 710 a, 710 b or the cantilever 705 a, 705 b. These characteristics include, for example, a resonance frequency of the cantilever 705 a, 705 b and a wavelength throughput of the grating coupled resonating structure 710 a, 710 b given a separation to the cantilever 705 a, 705 b.

FIG. 8 shows a schematic diagram of an optical microcantilever sensor 800 according to a fifth embodiment of the invention.

The optical microcantilever sensor 800 comprises a wavelength division de-multiplexer 805, the wavelength division de-multiplexer 805 comprising two optical outputs 810 a, 810 b, two grating coupled resonating structures 815 a, 815 b, two cantilevers 820 a, 820 b and a wavelength division multiplexer 825.

An optical input is optically coupled to the wavelength division de-multiplexer 805. The wavelength division de-multiplexer 805 processes light from the optical input and splits the light into a plurality of subsignals, each subsignal having a particular wavelength or plurality of wavelengths. In this example, the wavelength division de-multiplexer 805 has the two optical outputs 810 a, 810 b, each carrying light corresponding to a different wavelength or wavelength band.

The optical outputs 810 a, 810 b are optically coupled to the grating coupled resonating structures 815 a, 815 b respectively. The grating coupled resonating structures 815 a, 815 b are similar to the grating coupled resonating structures 210, 410 a, 410 b, 410 c, 615 a, 615 b. Each grating coupled resonating structure 815 a, 815 b forms an optical resonance cavity with the cantilevers 820 a, 820 b, respectively. The wavelength division multiplexer 825 additively combines the light output from grating coupled resonating structures 815 a, 815 b such that an output signal of the wavelength division multiplexer 825 comprises a single light signal comprising multiple wavelengths.

Analysis of an individual cantilever grating coupled resonating structure combination, for example 815 a/820 a or 815 b/820 b, which are connected in parallel, may be performed by using pre-known characteristics of the grating coupled resonating structure 815 a, 815 b or the cantilever 820 a, 820 b. These characteristics include, for example, a resonance frequency of the cantilever 820 a, 820 b and a wavelength throughput of the grating coupled resonating structure 815 a, 815 b.

FIG. 9 shows a schematic diagram of an optical microcantilever sensor 900 according to a sixth embodiment of the invention.

The optical microcantilever sensor 900 comprises a wavelength division de-multiplexer 905, the wavelength division de-multiplexer 905 comprising two optical outputs 910 a, 910 b, four grating coupled resonating structures 915 a, 915 b, 915 c, 915 d, four cantilevers 920 a, 920 b, 920 c, 920 d and a wavelength division multiplexer 925. The optical microcantilever sensor 900 is similar to the embodiments described in FIG. 7 and FIG. 8, except for that the cantilevers 920 a, 920 b, 920 c, 920 d and grating coupled resonating structures 915 a, 915 b, 915 c, 915 d are coupled in a series and parallel configuration.

The terms ‘series’ and ‘parallel’ are used in this specification. Series refers to the case where an output of a first grating coupled resonating structure is optically connected to an input of a second grating coupled resonating structure. Parallel refers to the case where an input is shared between a first and second grating coupled resonating structure. Parallel connections include the case where the first grating coupled resonating structure uses or modifies a first part of the input, and the second grating coupled resonating structure uses or modifies a second part of the input, even where a series physical connection exists.

Additionally, as is understood by a person skilled in the art, any number of parallel and series connections may exist on a single sensor.

As will be understood by those having ordinary skill in the art, in light of the present description, advantages of the present invention include the ability to economically have a very large amount of sensors on a small surface, enabling efficient detection on multiple analytes. Furthermore, the detection of analytes with high precision and fidelity is possible. These efficient sensors may be used for the efficient and economical detection of pesticides or other chemicals in food, for efficient detection of explosives, narcotics or other elicit substances just to name a few examples.

FIG. 10 is a bottom perspective view of a system 100 for measuring Atomic Force according to a further embodiment of the present invention, and FIG. 11 is a cross-sectional end view through A-A of FIG. 10. Referring to FIGS. 10 and 11, the system 1100 includes a sensor 1200, a light source 1300 and an analyser 1400. The light source 1300 is connected to an input of the sensor 1200 by an optical waveguide 1700A such as an optical fibre. An output of the sensor 1200 is connected to the analyser 1400 by an optical waveguide 1700B such as an optical fibre.

In one embodiment, the sensor 1200 is made using micro-electro-mechanical systems (MEMS) technology and includes a beam in the form of a cantilever beam 1210 and a grating structure 1220 positioned adjacent the cantilever beam 1210. The cantilever beam 1210 is planar and includes a tip 1211 which is pointed. The cantilever beam 1210 includes a first side 1214 and a second side 1215. The tip 1211 is positioned on the first side 1214 of the cantilever beam 1210 and towards a distal end 1213 of the cantilever beam 1210. The tip 1211 extends away from the cantilever beam 1210 towards a sample 1800 to be measured. A proximal end 1212 of the cantilever beam 1210 is fixed allowing the distal end 1213 to flex as the tip 1211 is moved over the sample 1800.

In another embodiment (not shown), the beam is fixed at both the distal end and the proximal end but allowing the beam to flex. A tip is positioned in between the distal end and the proximal end. Preferably the tip is positioned mid-way between the distal end and the proximal end. However it should be appreciated that the tip may be positioned anywhere between the distal end and the proximal end. By fixing the beam at both ends, Brownian motion is reduced, and sensitivity of a measurement is increased.

In one embodiment, the grating structure 1220 uses Silicon on Insulator (SOI) technology and includes a substrate 1221, a buried oxide layer 1222 and a waveguide layer 1223. Furthermore, the substrate 1221 and the waveguide layer 1223 are made from silicon. The buried oxide layer 1222 is formed on the substrate 1221 and the waveguide layer 1223 is formed on the buried oxide layer 1222. The waveguide layer 1223 includes grooves to form an interrogating grating coupler 1224 and the interrogating grating coupler 1224 is positioned adjacent the second side 1215 of the cantilever beam 1210. The interrogating grating coupler 1224 is similar to the interrogating grating coupler 220 shown in FIGS. 2 and 3. In one embodiment, the waveguide layer 1223 is 220 nm thick fabricated over a 2000 nm buried oxide layer 1222 using an infra-red light source 1300. However it should be appreciated that other thicknesses may be used, for example between 100 nm and 2000 nm.

Although the grating structure 1220 has been described in relation to SOI technology, a person skilled in the art will appreciate that the grating structure 1220, including the waveguide layer 1223 and the buried oxide layer 1222, may be made from many other materials. The main requirement is that the waveguide layer 1223 has a higher refractive index than the buried oxide layer 1222 so as to get the total internal reflections in the waveguide. For example, the waveguide layer 1223 may also be made from, but is not limited to, Germanium (Ge) and Silicon Oxy Nitride and the buried oxide layer 222 may be made from SU-8, Silicon dioxide (SiO2) or Magnesium Oxide (MgO). In addition, the thicknesses used to fabricate the waveguide layer 1223 and the buried oxide layer 1222 depend on the materials used and the wavelength of the light source 1300.

Typically a gap between the interrogating grating coupler 1224 and the cantilever beam 1210 is between 0.05 and 10 μm. However it should be appreciated that other distances may be used depending on the wavelength of the light source 1300 and the types of materials used for the grating structure 1220.

Although in the example above the sensor 1200 has been designed using a light source 1300 in the infra red band (with a wavelength of between 0.74 μm to 30 μm), it should be appreciated that the light source 1300 may produce light in the visible band (with a wavelength between 390 nm to 750 nm) or the ultra-violet band (with a wavelength between 10 nm to 400 nm).

A pattern or shape of the interrogating grating coupler 1224, for example dimensions of grooves of the interrogating grating coupler 1224, determines a resonance of light resonating between the interrogating grating coupler 1224 and the cantilever beam 1210.

In use, the unmodulated light 1500 is input to the sensor 1200. The unmodulated light 500 propagates along the silicon waveguide layer 223 until the unmodulated light 1500 exits the waveguide layer 1223 towards the cantilever beam 1210 at the interrogating grating coupler 1224. The interrogating grating coupler 1224 couples and directs light out of the waveguide 1223 towards the cantilever beam 1210 and couples light reflected from the second side 1215 of the cantilever beam 1210 back into the waveguide thereby forming a resonant cavity with the cantilever beam 1210. As the cantilever beam 1210 moves towards and away from the interrogating grating coupler 1224, an intensity and/or frequency of light output to the analyser 1400 is modulated as a function of the separation between the interrogating grating coupler 1224 and the cantilever beam 1210. From the modulation, the analyser 1400 may determine a displacement of the cantilever beam 1210 in order, for example, to determine a topography. In some embodiments the second side 1215 of the cantilever beam 1210, is coated with a reflective material such as gold in order to increase the reflectivity.

Although referred to as unmodulated light, it should be appreciated that the light input to the sensor 1200 may be modulated with a first modulation. As the first modulated light passes through the sensor 1200 it is modulated by a second modulation. The second modulation may then be analysed by the analyser 1400 in order to determine a displacement of the cantilever beam 1210.

It should be appreciated that in order to perform a scan, the sample 1800 may be fixed and the sensor 1200 moved across the sample 1300 under the control of the analyser 1400. Alternatively, the sample 1800 may be moved under the control of the analyser 1400 and the sensor 1200 may be stationary.

An electrostatic element may be used to control an initial deflection of the beam so as to tune the resonance of the optical cavity to its most sensitive position. An electrode is placed underneath the beam or cantilever beam 1210, but not over the grating structure 1220. The voltage between the electrode and the metal on the underside of the beam is then controlled to attract or repel the beam as necessary.

The sensor 1200 of the present invention may be used in an array in order to measure larger sections of the sample 1800. FIG. 12 is a block diagram illustrating a system of an array of sensors 2100 shown in FIGS. 10 and 11 for performing atomic force measurements according to an embodiment of the present invention. The system 1900 includes a plurality of sensors 1200A, 1200B, 1200C formed in a row. However it should be appreciated that the sensors 1200A, 1200B, 1200C may be positioned in any suitable arrangement.

In this embodiment, the light source 1300 is connected to a wavelength division de-multiplexer 1910 via a single optical waveguide 1700A. The wavelength division de-multiplexer 1910 separates the light source 1300 into a plurality of discrete wavelengths or wavelength bands λ₁, λ₂ and λ₃. Each output of the wavelength division de-multiplexer 1910 is connected to a respective sensor 1200A, 1200B, 1200C by a respective optical waveguide 1700C, 1700D, 1700E in order to couple the light at each wavelength λ₁, λ₂, λ₃ to a respective grating structure 1220 of a respective cantilever sensor 1200A, 1200B, 1200C. As each cantilever beam 1210 of a respective sensor 1200A, 1200B, 1200C moves it modulates the light at the respective wavelength or wavelength band λ₁, λ₂, λ₃.

The modulated light 1600 at each wavelength λ₁, λ₂, λ₃ is then multiplexed by a multiplexer 1920. Each sensor 1200A, 1200B, 1200C is connected to the multiplexer 1920 by a respective optical waveguide 1700F, 1700G, 1700H such as an optical fibre. An output of the multiplexer 1920 is connected to the analyser 1400 by optical waveguide 1700B and the modulated light at each wavelength λ₁, λ₂, λ₃ is passed to the analyser 1400. The analyser 1400 analyses the modulated light 1600 at each discrete wavelength or wavelength band λ₁, λ₂, λ₃ to determine a movement of each sensor 1200A, 1200B, 1200C and accordingly determine a characteristic of the sample 1800.

In another embodiment, the light from the light source 1300 may not be de-multiplexed into separate wavelengths; rather each sensor 1200 in the array may be supplied from its own light source 1300 or with a same wavelength of light from a same light source 1300. Furthermore, an output from each sensor 1200 may connect to a separate analyser 400, and each output analysed using a computer for example.

According to certain embodiments, the system 1100 includes a movement sensor (not shown), to determine the relative motion between the sensor 1200 and the sample 1800. This enables the determination of a contour of a sample irrespective of the rate of movement of the sample.

FIG. 13 illustrates a method 2000 of performing atomic force measurements on an object, according to an embodiment of the present invention.

At step 2005, light is input into a resonant cavity formed between a beam and a grating structure of the sensor. A tip of the beam is positioned adjacent to and in contact with the object, such that the beam moves according to a contour of the sample.

At step 2010, the light from the resonant cavity is received at an analyser, the light modulated according to a position of the beam.

At step 2015, the modulated light is analysed to determine a contour of the sample.

Steps 2005-2015 are advantageously performed on multiple points of the object, either sequentially, for example through movement of the beam across the object, in parallel, for example through the use of several beams and resonance cavities, or through a combination of series and parallel.

It should be appreciated that the present invention may be used in a variety of modes such as a static mode (where the beam flexes) and a dynamic mode (where the cantilever beam oscillates) in order to perform a variety of measurements.

For example the invention may be used in a contact mode where the sensor is scanned at a constant force between the sensor and a sample surface to obtain a 3D topographical map.

In an Intermittent Contact (Tapping Mode) the cantilever beam is oscillated at or near its resonant frequency. The oscillating tip is then scanned at a height where it barely touches or “taps” the sample surface. The analyser monitors the sensor position and a vibrational amplitude to obtain topographical and other property information allowing topographical information can be obtained even for fragile surfaces.

An advantage of the present invention is that the optical readout of the grating structure 1220 leads to increased sensitivity over existing free space optical monitoring. The present invention uses an optical resonant cavity formed between the grating structure 1220 and the cantilever beam 1210, or doubly clamped beam, coupled to a waveguide to increase an amplitude of a signal output from the sensor 1200 to levels significantly above the shot noise and thereby increasing the signal to noise ratio.

Another advantage is that the necessity to align the optics of an AFM whenever the probe is replaced is effectively eliminated due to the close coupling of the optical cavity to the waveguide. This is because the sensor 1200 and the AFM may be fabricated such that when installed, the waveguide layer 1223 aligns with the light source 1300 in the AFM.

In addition Brownian motion noise may be reduced by clamping the beam at each end and a further reduction in Brownian noise may be made by cooling the sensor 1200.

Finally, miniaturization of the AFM may be achieved allowing multiple beams and AFM tips to form an array and to be integrated in the one structure, effectively increasing the scan rate.

The above description of various embodiments of the present invention is provided for purposes of description to one of ordinary skill in the related art. It is not intended to be exhaustive or to limit the invention to a single disclosed embodiment. As mentioned above, numerous alternatives and variations to the present invention will be apparent to those skilled in the art of the above teaching. Accordingly, while some alternative embodiments have been discussed specifically, other embodiments will be apparent or relatively easily developed by those of ordinary skill in the art. Accordingly, this patent specification is intended to embrace all alternatives, modifications and variations of the present invention that have been discussed herein, and other embodiments that fall within the spirit and scope of the above described invention.

Limitations in the patent claims should be interpreted broadly based on the language used in the claims, and such limitations should not be limited to specific examples described herein. In this specification, the terminology “present invention” is used as a reference to one or more aspects within the present disclosure. The terminology “present invention” should not be improperly interpreted as an identification of critical elements, should not be improperly interpreted as applying to all aspects and embodiments, and should not be improperly interpreted as limiting the scope of any patent claims. 

What is claimed is:
 1. An apparatus for detecting a deflection of a beam, the apparatus comprising: a sensor including: a beam having a first side and a second side; and a grating structure positioned adjacent the second side of the beam, the grating structure including an interrogating grating coupler configured to direct light towards the beam; wherein the beam and the interrogating grating coupler form a resonant cavity, and light input to the resonant cavity is modulated according to the deflection of the beam.
 2. The apparatus of claim 1 wherein the beam is a cantilever beam.
 3. The apparatus of claim 2 wherein the cantilever beam includes an analyte selective coating for detecting one or more analytes in a sample.
 4. The apparatus of claim 1 wherein the first side of the beam includes a tip for interacting with a sample.
 5. The apparatus of claim 1 wherein an input of the sensor is connected to a light source.
 6. The apparatus of claim 1 wherein an output of the sensor is connected to an analyser for analysing light modulated by the sensor.
 7. The apparatus of claim 1 wherein the beam is static.
 8. The apparatus of claim 1 wherein the beam is dynamic.
 9. The apparatus of claim 1 wherein the beam is fixed at one end.
 10. The apparatus of claim 1 wherein the beam is fixed at opposite ends.
 11. The apparatus of claim 10 wherein the beam includes a flexible portion between the opposite ends of the beam.
 12. The apparatus of claim 1 including a plurality of sensors.
 13. The apparatus of claim 12 wherein an input of each of the plurality of sensors is connected to an output of a de-multiplexer.
 14. The apparatus of the 12 wherein an output of each of the plurality of sensors in connected to an input of a multiplexer.
 15. The apparatus of claim 13 wherein an input of the de-multiplexer is connected to a light source.
 16. The apparatus of claim 14 wherein an output of the multiplexer is connected to an analyser.
 17. The apparatus of claim 1 wherein the sensor includes a waveguide layer, and the interrogating grating coupler is formed in the waveguide layer.
 18. The apparatus of claim 17 wherein light is input to, and output from, the sensor via the waveguide layer.
 19. A method for detecting a deflection of a beam, the method comprising the steps of: inputting light into a resonant cavity formed between a beam and a grating structure of a sensor; receiving light modulated by a deflection of the beam; and analysing the modulated light to determine the deflection of the beam.
 20. The method of claim 19 wherein the beam is a cantilever. 